Modern Techniques for Root-Causing & Reducing Defects

Professional Development Event

Professional Development Events are Open to all Public. No membership required.


Modern Techniques for Root-Causing & Reducing Defects

Event Details:

Wednesday, April 25, 2018 @ 06:00 PM – 08:30 PM
Networking & Snacks: 06:00 PM – 07:00 PM
Presentation: 07:00 PM – 08:30 PM

Venue: Boardroom at Ottawa Public Library, Emerald Plaza Branch
1547 Merivale Rd, Nepean, ON K2G 4V3, Canada
+1 613-580-2940
Register for the Event Now!

What you need to know?

  • Beverages and snacks at the event
  • Registration Fees: $10.00 (In person, Come to network)
  • ASQ Recertification Units: 0.3


Nick Shelton, (P.Eng) is a highly motivated professional with an affinity for data science. Nick supports technical customer development for SAS Institute Inc. as a JMP Systems Engineer where he assists clients drive business and manufacturing process efficiencies through data exploration. 

Executive Summary:

It goes without saying that identifying and reducing defects are invaluable strategies for dramatically improving any manufacturing process. Understanding the occurrence of defects over time and being able to predict their causes are key components to optimize product yield, performance and quality. 

If this resonates with some of the analyses you’re running in your organization, join us as we guide you through insightful technical demonstrations & case studies to identify and reduce defects using modern analytical techniques. In this discussion, we’ll highlight industry leading trends in statistically assessing the root cause of defects and share techniques to help you reach maximum productivity in your analyses.

This session is designed to help you gain a better understanding of:

• Identifying problematic manufacturing variables
• Screening multiple processes & variables over time
• Monitoring & controlling complex processes
• Simulating outcomes with your existing data
• Designing robust processes from day zero

About the speaker:

Nick Shelton, (P.Eng) travels Canada hosting complimentary learning sessions to share industry best practices and demonstrate the benefits of leading edge analytics. Nick came to SAS Institute Inc. from Advanced Micro Devices where he worked as Product Development Engineer specializing in statistical data analysis, modeling, semiconductor device physics and fabrication. A Lean Six Sigma expert, Nick also worked for several years as Product Engineer with Texas Instruments, where he provided manufacturing process improvement, post-production cost reduction, yield enhancement and test optimization. Nick holds a Master of Science in electrical engineering from West Virginia University. View full profile at Linkedin.


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